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Reliability study of MANOS with and without a SiO2 buffer layer and BE-MANOS charge-trapping NAND flash devices
Chien Wei Liao*, Sheng Chih Lai, Hang Ting Lue, Ming Jui Yang, Chin Yen Shen, Yi Hsien Lue, Yu Fong Huang, Jung Yu Hsieh, Szu Yu Wang, Guang Li Luo, Chao-Hsin Chien, Kuang Yeu Hsieh, Rich Liu, Chih Yuan Lu
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
6
Scopus
citations