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Reliability of ultrathin high-κ dielectrics on chemical-vapor deposited 2D semiconductors
Zhihao Yu, Hongkai Ning, Chao Ching Cheng, Weisheng Li, Lei Liu, Wanqing Meng, Zhongzhong Luo, Taotao Li, Songhua Cai, Peng Wang, Wen Hao Chang, Chao Hsin Chien, Yi Shi, Yong Xu, Lain Jong Li, Xinran Wang*
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
6
Scopus
citations