Reliability mechanisms of LTPS-TFT with HfO 2 gate dielectric: PBTI, NBTI, and hot-carrier stress

Ming Wen Ma*, Chi Yang Chen, Woei Cheng Wu, Chun Jung Su, Kuo Hsing Kao, Tien-Sheng Chao, Tan Fu Lei

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

43 Scopus citations

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Engineering & Materials Science

Chemical Compounds