Abstract
In this study, heavily Si-doped n-type GaN (n-GaN) epitaxial layers with and without nano-rod GaN (NR GaN) template were grown by metal organic chemical vapor deposition (MOCVD) system. It was found that we could achieve high-qulaity heavily Si-doped n-GaN layers by using the NR GaN template. It was also found that we can reduce etching pits density in n-GaN (1.5E19 cm -3) epitaxial layer by a factor of 2.82 using the NR GaN template, as compared to the conventional sapphire substrate.
Original language | English |
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Pages (from-to) | H961-H964 |
Number of pages | 4 |
Journal | Journal of the Electrochemical Society |
Volume | 158 |
Issue number | 10 |
DOIs | |
State | Published - 31 Aug 2011 |