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Record-High Memory Window and Robust Retention Anti-Fuse OTP Memory: Electrical and Reliability Characteristics
Dong Ru Hsieh, Jia Chian Ni, Wei Ju Yeh, Tzu Chieh Hong, Zi Yang Hong, Yan Kui Liang, Huai En Luo, Michael Hsu, Ta Chun Cho, Tien Sheng Chao*
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review