Record-High Memory Window and Robust Retention Anti-Fuse OTP Memory: Electrical and Reliability Characteristics

Dong Ru Hsieh, Jia Chian Ni, Wei Ju Yeh, Tzu Chieh Hong, Zi Yang Hong, Yan Kui Liang, Huai En Luo, Michael Hsu, Ta Chun Cho, Tien Sheng Chao*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Fingerprint

Dive into the research topics of 'Record-High Memory Window and Robust Retention Anti-Fuse OTP Memory: Electrical and Reliability Characteristics'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds