Random pattern generation for post-silicon validation of DDR3 SDRAM

Keyphrases

• Post-silicon Validation 100%
• Random Pattern Generation 100%
• DDR3 SDRAM 100%
• Low Power 25%
• Time Constraints 25%
• Data Bandwidth 25%
• Silicon chip 25%
• Design Errors 25%
• Data Density 25%
• Address Data 25%
• Main Memory 25%
• Multiple Modes 25%
• Multiple Timing 25%
• Validation Case 25%
• Silicon Validation 25%
• Different Operating Modes 25%
• State Diagram 25%

Computer Science

• Operating Mode 100%
• Random Pattern 100%
• Silicon Validation 100%
• Timing Constraint 50%
• Main Memory 50%
• State Diagram 50%

Engineering

• Operating Mode 100%
• Past Decade 50%