Abstract
Microstructural evolution in ion-implanted and postannealed (001) diamond is investigated using transmission electron microscopy. For 150 keV 31P+ ion implantation into diamond with a fluence of 1 × 1015 cm−2, an amorphous carbon interlayer about ≈80 nm thickness formed between damaged diamonds is observed. Postannealing at 1200 °C can recover some damaged diamond regions where the vacancy concentration is estimated below 3 × 1022 cm−3. However, graphitization from the amorphous carbon interlayer and the heavily damaged diamond regions with higher vacancy concentrations occurs to form an ≈85 nm-thick graphite layer after annealing.
Original language | English |
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Article number | 2100829 |
Journal | Physica Status Solidi (A) Applications and Materials Science |
Volume | 219 |
Issue number | 7 |
DOIs | |
State | Published - Apr 2022 |
Keywords
- annealing
- damage
- diamond
- ion implantation
- transmission electron microscopy