Quantum-interference origin and magnitude of 1/ f noise in Dirac nodal line IrO2nanowires at low temperatures

Po Yu Chien; Chih Yuan Wu; Ruey Tay Wang; Shao Pin Chiu; Stefan Kirchner; Sheng-Shiuan Yeh; Juhn-Jong Lin

doi:10.1063/5.0147131

Quantum-interference origin and magnitude of 1/ f noise in Dirac nodal line IrO₂nanowires at low temperatures

Po Yu Chien, Chih Yuan Wu, Ruey Tay Wang, Shao Pin Chiu, Stefan Kirchner, Sheng-Shiuan Yeh^*, Juhn-Jong Lin^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

We present 1/f noise measurements of IrO2 nanowires from 1.7 to 350 K. Results reveal that the noise magnitude (represented by Hooge parameter γ) increases at low temperatures, indicating low-frequency resistance noise from universal conductance fluctuations. The cause of this noise is determined to be due to oxygen vacancies in the rutile structure of IrO2. Additionally, the number density of these mobile defects can be calculated from the T resistance rise caused by the two-channel Kondo effect in the Dirac nodal line metal IrO2.

Original language	English
Article number	143102
Journal	Applied Physics Letters
Volume	122
Issue number	14
DOIs	https://doi.org/10.1063/5.0147131
State	Published - 3 Apr 2023

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title = "Quantum-interference origin and magnitude of 1/ f noise in Dirac nodal line IrO2nanowires at low temperatures",

abstract = "We present 1/f noise measurements of IrO2 nanowires from 1.7 to 350 K. Results reveal that the noise magnitude (represented by Hooge parameter γ) increases at low temperatures, indicating low-frequency resistance noise from universal conductance fluctuations. The cause of this noise is determined to be due to oxygen vacancies in the rutile structure of IrO2. Additionally, the number density of these mobile defects can be calculated from the T resistance rise caused by the two-channel Kondo effect in the Dirac nodal line metal IrO2.",

author = "Chien, {Po Yu} and Wu, {Chih Yuan} and Wang, {Ruey Tay} and Chiu, {Shao Pin} and Stefan Kirchner and Sheng-Shiuan Yeh and Juhn-Jong Lin",

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T1 - Quantum-interference origin and magnitude of 1/ f noise in Dirac nodal line IrO2nanowires at low temperatures

AU - Chien, Po Yu

AU - Wu, Chih Yuan

AU - Wang, Ruey Tay

AU - Chiu, Shao Pin

AU - Kirchner, Stefan

AU - Yeh, Sheng-Shiuan

AU - Lin, Juhn-Jong

PY - 2023/4/3

Y1 - 2023/4/3

N2 - We present 1/f noise measurements of IrO2 nanowires from 1.7 to 350 K. Results reveal that the noise magnitude (represented by Hooge parameter γ) increases at low temperatures, indicating low-frequency resistance noise from universal conductance fluctuations. The cause of this noise is determined to be due to oxygen vacancies in the rutile structure of IrO2. Additionally, the number density of these mobile defects can be calculated from the T resistance rise caused by the two-channel Kondo effect in the Dirac nodal line metal IrO2.

AB - We present 1/f noise measurements of IrO2 nanowires from 1.7 to 350 K. Results reveal that the noise magnitude (represented by Hooge parameter γ) increases at low temperatures, indicating low-frequency resistance noise from universal conductance fluctuations. The cause of this noise is determined to be due to oxygen vacancies in the rutile structure of IrO2. Additionally, the number density of these mobile defects can be calculated from the T resistance rise caused by the two-channel Kondo effect in the Dirac nodal line metal IrO2.

UR - http://www.scopus.com/inward/record.url?scp=85152937102&partnerID=8YFLogxK

U2 - 10.1063/5.0147131

DO - 10.1063/5.0147131

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VL - 122

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 14

M1 - 143102

ER -

Quantum-interference origin and magnitude of 1/ f noise in Dirac nodal line IrO₂nanowires at low temperatures

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