Protection design against system-level ESD transient disturbance on display panels

Ming-Dou Ker; Wan Yen Lin; Cheng Cheng Yen; Che Ming Yang; Tung Yang Chen; Shih Fan Chen

doi:10.1109/APEMC.2010.5475821

Protection design against system-level ESD transient disturbance on display panels

Ming-Dou Ker^*, Wan Yen Lin, Cheng Cheng Yen, Che Ming Yang, Tung Yang Chen, Shih Fan Chen

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Scopus citations

Abstract

A hardware/firmware system co-design has been proposed in this work to protect display electronic products against system-level electrostatic discharge (ESD) transient disturbance. By including transient detection circuit, the firmware can execute system recovery procedure to recover all electrical functions under system-level ESD tests. The transient detection circuit is designed to detect different positive and negative fast electrical transients and verified in a 0.13-μm CMOS process. The experimental results have confirmed that the proposed hardware/firmware design can successfully improve the susceptibility of display products against system-level ESD zapping.

Original language	English
Title of host publication	2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
Pages	438-441
Number of pages	4
DOIs	https://doi.org/10.1109/APEMC.2010.5475821
State	Published - 2 Aug 2010
Event	2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010 - Beijing, China Duration: 12 Apr 2010 → 16 Apr 2010

Publication series

Name	2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010

Conference

Conference	2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
Country/Territory	China
City	Beijing
Period	12/04/10 → 16/04/10

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10.1109/APEMC.2010.5475821

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Ker, M-D., Lin, W. Y., Yen, C. C., Yang, C. M., Chen, T. Y., & Chen, S. F. (2010). Protection design against system-level ESD transient disturbance on display panels. In 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010 (pp. 438-441). [5475821] (2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010). https://doi.org/10.1109/APEMC.2010.5475821

@inproceedings{45f10252961343039a061d8407588a9a,

title = "Protection design against system-level ESD transient disturbance on display panels",

abstract = "A hardware/firmware system co-design has been proposed in this work to protect display electronic products against system-level electrostatic discharge (ESD) transient disturbance. By including transient detection circuit, the firmware can execute system recovery procedure to recover all electrical functions under system-level ESD tests. The transient detection circuit is designed to detect different positive and negative fast electrical transients and verified in a 0.13-μm CMOS process. The experimental results have confirmed that the proposed hardware/firmware design can successfully improve the susceptibility of display products against system-level ESD zapping.",

author = "Ming-Dou Ker and Lin, {Wan Yen} and Yen, {Cheng Cheng} and Yang, {Che Ming} and Chen, {Tung Yang} and Chen, {Shih Fan}",

year = "2010",

month = aug,

day = "2",

doi = "10.1109/APEMC.2010.5475821",

language = "English",

isbn = "9781424456215",

series = "2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010",

pages = "438--441",

booktitle = "2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010",

note = "2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010 ; Conference date: 12-04-2010 Through 16-04-2010",

}

Ker, M-D, Lin, WY, Yen, CC, Yang, CM, Chen, TY & Chen, SF 2010, Protection design against system-level ESD transient disturbance on display panels. in 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010., 5475821, 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010, pp. 438-441, 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010, Beijing, China, 12/04/10. https://doi.org/10.1109/APEMC.2010.5475821

Protection design against system-level ESD transient disturbance on display panels. / Ker, Ming-Dou; Lin, Wan Yen; Yen, Cheng Cheng et al.
2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010. 2010. p. 438-441 5475821 (2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Chen, Shih Fan

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N2 - A hardware/firmware system co-design has been proposed in this work to protect display electronic products against system-level electrostatic discharge (ESD) transient disturbance. By including transient detection circuit, the firmware can execute system recovery procedure to recover all electrical functions under system-level ESD tests. The transient detection circuit is designed to detect different positive and negative fast electrical transients and verified in a 0.13-μm CMOS process. The experimental results have confirmed that the proposed hardware/firmware design can successfully improve the susceptibility of display products against system-level ESD zapping.

AB - A hardware/firmware system co-design has been proposed in this work to protect display electronic products against system-level electrostatic discharge (ESD) transient disturbance. By including transient detection circuit, the firmware can execute system recovery procedure to recover all electrical functions under system-level ESD tests. The transient detection circuit is designed to detect different positive and negative fast electrical transients and verified in a 0.13-μm CMOS process. The experimental results have confirmed that the proposed hardware/firmware design can successfully improve the susceptibility of display products against system-level ESD zapping.

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DO - 10.1109/APEMC.2010.5475821

M3 - Conference contribution

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SN - 9781424456215

T3 - 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010

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BT - 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010

T2 - 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010

Y2 - 12 April 2010 through 16 April 2010

ER -

Protection design against system-level ESD transient disturbance on display panels

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