Programming efficiency of stacked-gate flash memories with high-κ dielectrics

Y. Y. Chen*, Chao-Hsin Chien, K. T. Kin, J. C. Lou

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    5 Scopus citations

    Fingerprint

    Dive into the research topics of 'Programming efficiency of stacked-gate flash memories with high-κ dielectrics'. Together they form a unique fingerprint.

    Engineering & Materials Science