TY - JOUR
T1 - Procedure of the convolution method for estimating production yield with sample size information
AU - Pearn, W.l.
AU - Hung, Hui-Nien
AU - Cheng, Ya Ching
AU - Lin, Gu Hong
PY - 2010/1
Y1 - 2010/1
N2 - The yield index Spk proposed by Boyles (1994. Process capability with asymmetric tolerances. Communications in Statistics-Simulation and Computation, 23 (1), 615-643) provides an exact measure on the production yield of normal processes. Lee et al. (Lee, J.C., Hung, H.N., Pearn, W.L. and Kueng, T.L., 2002. On the distribution of the estimated process yield index S pk. Quality and Reliability Engineering International, 18 (2), 111-116) considered a normal approximation for estimating Spk. In this paper, we consider a convolution approximation for estimating S pk, and compare with the normal approximation. The comparison results show that the convolution method does provide a more accurate estimation to Spk as well as the production yield than the normal approximation. An efficient step-by-step procedure based on the convolution method is developed to illustrate how to estimate the production yield. Also investigated is the accuracy of the convolution method which provides useful information about sample size required for designated power levels, and for convergence.
AB - The yield index Spk proposed by Boyles (1994. Process capability with asymmetric tolerances. Communications in Statistics-Simulation and Computation, 23 (1), 615-643) provides an exact measure on the production yield of normal processes. Lee et al. (Lee, J.C., Hung, H.N., Pearn, W.L. and Kueng, T.L., 2002. On the distribution of the estimated process yield index S pk. Quality and Reliability Engineering International, 18 (2), 111-116) considered a normal approximation for estimating Spk. In this paper, we consider a convolution approximation for estimating S pk, and compare with the normal approximation. The comparison results show that the convolution method does provide a more accurate estimation to Spk as well as the production yield than the normal approximation. An efficient step-by-step procedure based on the convolution method is developed to illustrate how to estimate the production yield. Also investigated is the accuracy of the convolution method which provides useful information about sample size required for designated power levels, and for convergence.
KW - Critical value
KW - Power of test
KW - Process capability
KW - Production yield
KW - Quality assurance
UR - http://www.scopus.com/inward/record.url?scp=74549156903&partnerID=8YFLogxK
U2 - 10.1080/00207540802552667
DO - 10.1080/00207540802552667
M3 - Article
AN - SCOPUS:74549156903
SN - 0020-7543
VL - 48
SP - 1245
EP - 1265
JO - International Journal of Production Research
JF - International Journal of Production Research
IS - 5
ER -