Probing Thermally Activated Atomic and Nanocrystalline Defect Motion Through Noise Processes in RuO2 Nanowires

Sheng-Shiuan Yeh, Cheng Ya Yu, Yi Te Lee, Shao Pin Chiu, Juhn-Jong Lin*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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Material Science

Physics

Engineering