Practical routability-driven design flow for multilayer power networks using aluminum-pad layer

Wen Hsiang Chang, Chia-Tso Chao, Shi Hao Chen

Research output: Contribution to journalArticlepeer-review

13 Scopus citations


This paper presents a novel framework to efficiently and effectively build a robust but routing-friendly multilayer power network under the IR-drop and electro-migration (EM) constraints. The proposed framework first considers the impact of the aluminum-pad layer and provides a conservative analytical model to determine the total metal width for each power layer that can meet the IR-drop and EM constraints. Then the proposed framework can identify an optimal irredundant stripe width by considering the number of occupied routing tracks and the potential routing detour caused by the power stripes without the information of cell placement. Next, after the cell placement is done, the proposed framework applies a dynamic-programming approach to further reduce the potential routing detour by relocating the power stripes. A series of experiments are conducted based on a 40 nm, 1.1 V, and 900-MHz microprocessor to validate the effectiveness and efficiency of the proposed framework.

Original languageEnglish
Article number6549125
Pages (from-to)1069-1081
Number of pages13
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Issue number5
StatePublished - May 2014


  • Electro-migration (EM)
  • IR drop
  • power network
  • routing-driven.


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