Power-rail ESD clamp circuit with polysilicon diodes against false trigger during fast power-on events

Jie Ting Chen, Ming-Dou Ker

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

A new power-rail ESD clamp circuit with both timing and voltage-level detection is proposed against false trigger events. A RC stage is used for dv/dt detection and a diode string is used to detect the over-stress voltage level during ESD events. By using fully isolated polysilicon diodes, the standby leakage current of the proposed power-rail ESD clamp can be effectively reduced.

Original languageEnglish
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018
PublisherESD Association
Number of pages7
ISBN (Electronic)1585373028
DOIs
StatePublished - 23 Sep 2018
Event40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018 - Reno, United States
Duration: 23 Sep 201828 Sep 2018

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
Volume2018-September
ISSN (Print)0739-5159

Conference

Conference40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018
Country/TerritoryUnited States
CityReno
Period23/09/1828/09/18

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