Power losses and optimum operation conditions of silicon quasi-Read diodes

Mau-Chung Chang*, Mao Chieh Chen

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review


    Efficiency of x-band SD and DD silicon quasi-Read diodes as a function of modulation level are calculated taking into account the power losses in the unswept layer. It is found that the diode conductivity is the dominating factor in determining the power losses when operated in the small- to intermediate-modulation level, although the power losses increase with increasing r.f. voltage swing due to modulation ascending as well as mobility diminishing in this range of modulation. At large modulation condition, when the diode residual field is raised to such an extent that carrier drift velocity reaches its scattering limited value, the rapidly growing residual field results in serious losses independent of the material mobility. As a result, the optimum-modulation level falls in the intermediate-modulation region for each case. The optimum-modulation level almost remains unchanged when the bias is tripled from Jdc = 500 to 1500 A/cm2 in most cases, while there are trade-offs in output power and efficiency when the bias current of the diode is increased. The best x-band DD SI quasi-Read diode we explored shows that the device is capable of an optimum efficiency ηm = 20.9% and output power Pm = 3.2 W at bias density Jdc = 500 A/cm2 and an optimum modulation index m = 0.47.

    Original languageEnglish
    Pages (from-to)621-626
    Number of pages6
    JournalSolid State Electronics
    Issue number6
    StatePublished - 1 Jan 1980


    Dive into the research topics of 'Power losses and optimum operation conditions of silicon quasi-Read diodes'. Together they form a unique fingerprint.

    Cite this