TY - GEN
T1 - Power and area reduction in multi-stage addition using operand segmentation
AU - Chan, Ching Da
AU - Liu, Wei Chang
AU - Yang, Chia Hsiang
AU - Jou, Shyh-Jye
PY - 2013
Y1 - 2013
N2 - This paper presents an architectural technique to efficiently implement multi-stage additions through operand segmentation. Carry bypass is leveraged to break the dependency between the two segmented adders, reducing the delay of the critical path. This allows for power-and area-efficient hardware implementation due to the increased timing margin for architectural transformations at the cost of one extra clock cycle. Compared to existing segmented-adders, the proposed architecture has the least hardware overhead with near execution time. An accumulator and a 16-tap FIR filter are used to demonstrate the delay, power, and area improvements of the proposed technique. The synthesis results show that the delay is improved by up to 42% and 28.1%. Given the same timing constraint, the adder area is reduced by 27.4% and 12.4%.
AB - This paper presents an architectural technique to efficiently implement multi-stage additions through operand segmentation. Carry bypass is leveraged to break the dependency between the two segmented adders, reducing the delay of the critical path. This allows for power-and area-efficient hardware implementation due to the increased timing margin for architectural transformations at the cost of one extra clock cycle. Compared to existing segmented-adders, the proposed architecture has the least hardware overhead with near execution time. An accumulator and a 16-tap FIR filter are used to demonstrate the delay, power, and area improvements of the proposed technique. The synthesis results show that the delay is improved by up to 42% and 28.1%. Given the same timing constraint, the adder area is reduced by 27.4% and 12.4%.
UR - http://www.scopus.com/inward/record.url?scp=84881327162&partnerID=8YFLogxK
U2 - 10.1109/VLDI-DAT.2013.6533879
DO - 10.1109/VLDI-DAT.2013.6533879
M3 - Conference contribution
AN - SCOPUS:84881327162
SN - 9781467344357
T3 - 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013
BT - 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013
T2 - 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013
Y2 - 22 April 2013 through 24 April 2013
ER -