Abstract
The pore characterization of ZIF system using small-angle X-ray scattering (SAXS) technique is presented for the first time. The pore characterization of ZIF-67 framework structure as model system using the conventional nitrogen adsorption and SAXS methods was performed in this work. The comparison between the results obtained by two methods can provide the verification, complementary information, and error analysis to the conventional method using nitrogen atom as probe. The pore network and morphology are subjected to the topology of ZIF framework structure. The theoretical calculation of pore morphology in the unit cage of ZIF-67 structure is verified by this SAXS characterization. This SAXS study can be used as the reference of modeling pore for general ZIF systems.
Original language | English |
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Pages (from-to) | 500-506 |
Number of pages | 7 |
Journal | Journal of the Chinese Chemical Society |
Volume | 68 |
Issue number | 3 |
DOIs | |
State | Published - Mar 2021 |
Keywords
- nanomaterials
- physical chemistry