Polycrystalline film target texture and nuclear backscattering analysis

H. H. Andersen*, King-Ning Tu, J. F. Ziegler

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

16 Scopus citations


The influence of target texture on the backscattering yield of 2 MeV 4He particles has been investigated for evaported thin-film targets of Nb, Ag, Au and Bi. The results have been correlated with those from X-ray diffraction. The implications of the texture found for nuclear-backscattering analysis are discussed, and it is suggested that backscattering may constitute a fast, quantitative method for investigations of texture in thin foils.

Original languageEnglish
Pages (from-to)247-251
Number of pages5
JournalNuclear Instruments and Methods
Issue number1-3
StatePublished - 1 Jan 1978


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