Polycrystalline film target texture and nuclear backscattering analysis

H. H. Andersen; King-Ning Tu; J. F. Ziegler

doi:10.1016/0029-554X(78)90868-6

Polycrystalline film target texture and nuclear backscattering analysis

H. H. Andersen^*, King-Ning Tu, J. F. Ziegler

^*Corresponding author for this work

International College of Semiconductor Technology

Research output: Contribution to journal › Article › peer-review

16 Scopus citations

Abstract

The influence of target texture on the backscattering yield of 2 MeV ⁴He particles has been investigated for evaported thin-film targets of Nb, Ag, Au and Bi. The results have been correlated with those from X-ray diffraction. The implications of the texture found for nuclear-backscattering analysis are discussed, and it is suggested that backscattering may constitute a fast, quantitative method for investigations of texture in thin foils.

Original language	English
Pages (from-to)	247-251
Number of pages	5
Journal	Nuclear Instruments and Methods
Volume	149
Issue number	1-3
DOIs	https://doi.org/10.1016/0029-554X(78)90868-6
State	Published - 1 Jan 1978

Access to Document

10.1016/0029-554X(78)90868-6

Cite this

@article{bb462007bb374b69bb9e5f174c2f75d2,

title = "Polycrystalline film target texture and nuclear backscattering analysis",

abstract = "The influence of target texture on the backscattering yield of 2 MeV 4He particles has been investigated for evaported thin-film targets of Nb, Ag, Au and Bi. The results have been correlated with those from X-ray diffraction. The implications of the texture found for nuclear-backscattering analysis are discussed, and it is suggested that backscattering may constitute a fast, quantitative method for investigations of texture in thin foils.",

author = "Andersen, {H. H.} and King-Ning Tu and Ziegler, {J. F.}",

year = "1978",

month = jan,

day = "1",

doi = "10.1016/0029-554X(78)90868-6",

language = "English",

volume = "149",

pages = "247--251",

journal = "Nuclear Instruments and Methods",

issn = "0029-554X",

publisher = "Elsevier BV",

number = "1-3",

}

TY - JOUR

T1 - Polycrystalline film target texture and nuclear backscattering analysis

AU - Andersen, H. H.

AU - Tu, King-Ning

AU - Ziegler, J. F.

PY - 1978/1/1

Y1 - 1978/1/1

N2 - The influence of target texture on the backscattering yield of 2 MeV 4He particles has been investigated for evaported thin-film targets of Nb, Ag, Au and Bi. The results have been correlated with those from X-ray diffraction. The implications of the texture found for nuclear-backscattering analysis are discussed, and it is suggested that backscattering may constitute a fast, quantitative method for investigations of texture in thin foils.

AB - The influence of target texture on the backscattering yield of 2 MeV 4He particles has been investigated for evaported thin-film targets of Nb, Ag, Au and Bi. The results have been correlated with those from X-ray diffraction. The implications of the texture found for nuclear-backscattering analysis are discussed, and it is suggested that backscattering may constitute a fast, quantitative method for investigations of texture in thin foils.

UR - http://www.scopus.com/inward/record.url?scp=0001540493&partnerID=8YFLogxK

U2 - 10.1016/0029-554X(78)90868-6

DO - 10.1016/0029-554X(78)90868-6

M3 - Article

AN - SCOPUS:0001540493

SN - 0029-554X

VL - 149

SP - 247

EP - 251

JO - Nuclear Instruments and Methods

JF - Nuclear Instruments and Methods

IS - 1-3

ER -

Polycrystalline film target texture and nuclear backscattering analysis

Abstract

Access to Document

Other files and links

Fingerprint

Cite this