Polarization-dependent X-ray absorption spectroscopy of in-plane aligned (1 0 0) YBa2Cu3O 7-δ thin films

Chih-Wei Luo, S. J. Liu, M. H. Chen, Kaung-Hsiung Wu*, Jiunn-Yuan Lin, J. M. Chen, Jenh-Yih Juang, T. M. Uen, Y. S. Gou

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Abstract

Polarization-dependent X-ray absorption spectra (XAS) on the O 1s edge has been measured on a highly in-plane aligned (1 0 0) a-axis YBa2Cu3O7-δ (YBCO) thin films. The in-plane XAS, that is, the electric field E of the linearly polarized synchrotron light parallels to b- or c-axes of YBCO films (E∥b or E∥c), were obtained in a normal-incidence alignment. Furthermore, the XAS for E∥a was calculated from the oblique incidence to the sample with different angles. The present results are consistent with those obtained by using detwinned YBCO single crystals.

Original languageAmerican English
Pages (from-to)435-436
Number of pages2
JournalPhysica C: Superconductivity and its applications
Volume388-389
DOIs
StatePublished - May 2003
Eventproceedings of the 23rd international conference on low temper - Hiroshima, Japan
Duration: 20 Aug 200227 Aug 2002

Keywords

  • Polarization-dependent X-ray absorption spectroscopy
  • XAS of E∥a, E∥b, and E∥c
  • a-axis oriented YBaCuO

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