@inproceedings{4af1f9cd50b74c6d9a505402b73c0c71,
title = "PLANE: A new ATPG system for PLAs",
abstract = "In this paper, a new PLA ATPG system PLANE is presented. PLANE uses the depth-first sharp operation for efficient test generation. Besides, a powerful test compaction technique using the intersection buffer is applied to get a more compact test set. PLANE also uses parallel fault simulation and backend fault simulation to exploit its performance. Experimental results show that the test length of PLANE is 7.5% shorter than that of PLATYPUS.",
author = "Juinn-Dar Huang and Shen, {W. Z.}",
year = "1993",
month = jan,
day = "1",
doi = "10.1109/ATS.1993.398788",
language = "English",
series = "Proceedings of the Asian Test Symposium",
publisher = "IEEE Computer Society",
pages = "107--112",
booktitle = "ATS 1993 Proceedings - 2nd Asian Test Symposium",
address = "美國",
note = "2nd IEEE Asian Test Symposium, ATS 1993 ; Conference date: 16-11-1993 Through 18-11-1993",
}