Abstract
Phase recovery by solving the transport-of-intensity equation (TIE) is a non-iterative and non-interferometric phase retrieval technique. From solving the TIE with conventional, one partial derivative and Hilbert transform methods for both the periodic and aperiodic samples, we demonstrate that the Hilbert transform method can provide the smoother phase images with edge enhancement and fine structures. Furthermore, compared with the images measured by optical and atomic force microscopy, the Hilbert transform method has the ability to quantitatively map out the phase images for both the periodic and aperiodic structures. (C) 2016 Optical Society of America
Original language | English |
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Pages (from-to) | 1616-1619 |
Number of pages | 4 |
Journal | Optics Letters |
Volume | 41 |
Issue number | 7 |
DOIs | |
State | Published - 1 Apr 2016 |
Keywords
- INTERFERENCE CONTRAST MICROSCOPE
- DIC MICROSCOPY
- Light