Phase and Carrier Polarity Control of Sputtered MoTe2by Plasma-induced Defect Engineering

Chih Pin Lin*, Hao Hua Hsu, Tuo Hung Hou

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Fingerprint

Dive into the research topics of 'Phase and Carrier Polarity Control of Sputtered MoTe2by Plasma-induced Defect Engineering'. Together they form a unique fingerprint.

Engineering & Materials Science