Abstract
In this letter, the authors propose a practical and reliable approach-using deposited multiwalled carbon nanotubes (MWCNTs) as source and drain electrodes-for reducing the contact resistance (Rc) in pentacene-based bottom-contact thin-film transistors. The value of Rc of the devices was closely linked to the resultant length of the deposited MWCNTs; the lowest value was 3× 108 μm. The largest saturation mobility was 0.14 cm2 V s; this value reached up to three times higher when the threshold voltage was determined using the maximum transconductance (Gm,max) extrapolation method, rather than the constant current method. The on/off ratio was more than 106.
Original language | English |
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Article number | 083502 |
Journal | Applied Physics Letters |
Volume | 91 |
Issue number | 8 |
DOIs | |
State | Published - 31 Aug 2007 |