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Patent classification using ontology-based patent network analysis
Meng Jung Shih
*
,
Duen-Ren Liu
*
Corresponding author for this work
Institute of Information Management
Research output
:
Contribution to conference
›
Paper
›
peer-review
14
Scopus citations
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Keyphrases
Ontological Basis
100%
Patent Classification
100%
Patent Network Analysis
100%
Patent Network
100%
Patent Documents
66%
Patent Management
66%
United States
33%
Competitive Advantage
33%
Feature Extracting
33%
Trademark Office
33%
Patent Office
33%
Classification Methods
33%
Network Approach
33%
K-nearest
33%
Industrial Analysis
33%
Management Analysis
33%
Reachable Nodes
33%
Network Classification
33%
Network of Ontologies
33%
Computer Science
Patent Document
100%
Ontology
100%
Conventional Method
50%
Trademark Office
50%
Extracted Feature
50%
Classification Method
50%
Nearest Neighbors Classifier
50%
United State Patent
50%