Patch-Based Prototypical Cross-Scale Attention Network for Anomaly Detection

  • Tung Lin Wang
  • , Jun Wei Hsieh*
  • , Yi Kuan Hsieh
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Anomaly detection and localization play crucial roles in industrial manufacturing to help maintain product quality and minimize defects. However, anomalies are rare and challenging to collect, leading to imbalance data that cause a biased model to be trained and sensitive to noisy or irrelevant features. In addition, anomalies are often subtle, diverse, and change over time, making them difficult to differentiate, further complicating the detection and localization tasks. To address these challenges, we propose a new Patch-based Protopical Cross-Scale Attention Network (PPCA-Net) to effectively identify anomaly regions by learning residual features across different scales and sizes, distinguishing abnormal from normal patterns. It consists of two key components: the Scale-Aware Channel Attention Module (SACAM) and the Patch-based Cross-Scale Attention Module (PCSAM). These modules facilitate interactive feature inferences across multiple scales, significantly enhancing the ability to capture abnormal features of various sizes in various environments. Furthermore, we incorporate diverse anomaly generation strategies, including multi-scale prototypes to better represent feature disparities between abnormal and normal patterns, thereby enhancing overall effectiveness. Through extensive experimentation on the challenging MVTec AD [1] benchmark, PPCA-Net demonstrates superior performance in both unsupervised and supervised methods, highlighting its effectiveness in anomaly identification.

Original languageEnglish
Title of host publicationPattern Recognition - 27th International Conference, ICPR 2024, Proceedings
EditorsApostolos Antonacopoulos, Subhasis Chaudhuri, Rama Chellappa, Cheng-Lin Liu, Saumik Bhattacharya, Umapada Pal
PublisherSpringer Science and Business Media Deutschland GmbH
Pages366-381
Number of pages16
ISBN (Print)9783031781650
DOIs
StatePublished - 2025
Event27th International Conference on Pattern Recognition, ICPR 2024 - Kolkata, India
Duration: 1 Dec 20245 Dec 2024

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume15302 LNCS
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

Conference27th International Conference on Pattern Recognition, ICPR 2024
Country/TerritoryIndia
CityKolkata
Period1/12/245/12/24

Keywords

  • Anomaly Detection
  • Anomaly segmentation
  • defect inspection

Fingerprint

Dive into the research topics of 'Patch-Based Prototypical Cross-Scale Attention Network for Anomaly Detection'. Together they form a unique fingerprint.

Cite this