Keyphrases
Amorphous Silicon
100%
Light-addressable Potentiometric Sensor
100%
Rapid Thermal Annealing
28%
Annealing Treatment
28%
Amorphous Silicon Thin Film
28%
ITO Glass
28%
High Photovoltage
28%
Niobium Oxide
28%
Plasma-enhanced Chemical Vapor Deposition (PECVD)
14%
Spatial Resolution
14%
High-resolution Scanning
14%
Dopant
14%
Solar Cell
14%
Glass Substrate
14%
Silicon Substrate
14%
Thin-film Transistors
14%
P-type
14%
Two Dimensional Images
14%
Fabrication Methods
14%
Gate Bias
14%
Device Structure
14%
PH Sensing
14%
PH-sensitive
14%
Oxide Layer
14%
Buffer Solution
14%
Sensing Membrane
14%
Silicon Structure
14%
Photovoltage
14%
Bias Characteristics
14%
Semiconductor Layer
14%
High Frequency AC
14%
Laser Signal
14%
Intrinsic Amorphous Silicon
14%
Selective Gases
14%
Analog Micromirror
14%
Engineering
Thin Films
100%
Potentiometric
100%
Photovoltage
50%
Dopants
16%
Chemical Vapor Deposition
16%
Vapor Deposition
16%
Silicon Substrate
16%
Two Dimensional
16%
Dimensional Image
16%
Device Structure
16%
Thin-Film Transistor
16%
Gate Bias
16%
Oxide Layer
16%
Spatial Resolution
16%
Micromirrors
16%
High Scanning Speed
16%
Film Silicon
16%
Silicon Layer
16%
Sensing Membrane
16%
Solar Cell
16%
Glass Substrate
16%
Material Science
Thin Films
100%
Amorphous Silicon
100%
ITO Glass
20%
Niobium Oxide
20%
Doping (Additives)
10%
Film
10%
X-Ray Diffraction
10%
Solar Cell
10%
Thin-Film Transistor
10%
Plasma-Enhanced Chemical Vapor Deposition
10%
Secondary Ion Mass Spectrometry
10%
Buffer Solution
10%