Oxygen-dependent instability and annealing/passivation effects in amorphous In-Ga-Zn-O thin-film transistors

Wei Tsung Chen*, Shih Yi Lo, Shih Chin Kao, Hsiao-Wen Zan, Chuang Chuang Tsai, Jian Hong Lin, Chun Hsiang Fang, Chung Chun Lee

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

193 Scopus citations

Fingerprint

Dive into the research topics of 'Oxygen-dependent instability and annealing/passivation effects in amorphous In-Ga-Zn-O thin-film transistors'. Together they form a unique fingerprint.

Keyphrases

Material Science

Engineering