Oxidation-boosted charge trapping in ultra-sensitive van der Waals materials for artificial synaptic features

Feng Shou Yang, Mengjiao Li*, Mu Pai Lee, I. Ying Ho, Jiann Yeu Chen, Haifeng Ling, Yuanzhe Li, Jen Kuei Chang, Shih Hsien Yang, Yuan Ming Chang, Ko Chun Lee, Yi Chia Chou, Ching Hwa Ho, Wenwu Li, Chen Hsin Lien, Yen Fu Lin

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

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Material Science