Orientation-dependent potential barriers in case of epitaxial Pt- BiFeO3 - SrRuO3 capacitors

L. Pintilie*, C. Dragoi, Ying-hao Chu, L. W. Martin, R. Ramesh, M. Alexe

*Corresponding author for this work

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61 Scopus citations


The leakage current in epitaxial BiFeO3 capacitors with bottom SrRuO3 and top Pt electrodes, grown by pulsed laser deposition on SrTiO3 (100), SrTiO3 (110), and SrTiO3 (111) substrates, is investigated by current-voltage (I-V) measurements in the 100-300 K temperature range. It is found that the leakage current is interface-limited and strongly dependent on the orientation of the substrate. The potential barriers at the electrode interfaces are estimated to about 0.6, 0.77, and 0.93 eV for the (100), (110), and (111) orientations, respectively.

Original languageEnglish
Article number232902
JournalApplied Physics Letters
Issue number23
StatePublished - 26 Jun 2009


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