Abstract
We have studied the temperature dependence of the band gap and the decay dynamics of isoelectronic ZnSe1-xOx (x=0-0.053) semiconductors, using photoluminescence (PL) and time-resolved PL spectroscopy. The temperature dependence of the band gap of ZnSe1-xOx decreases with the increase in O concentration. The Kohlrausch law is in good agreement with the O-induced complex decay profiles. As temperature increases, the mechanism of carrier decay undergoes a complicated change from trapped to free excitons. These findings are consistent with the temperature dependence of the stretching exponent β.
Original language | English |
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Pages (from-to) | 122-126 |
Number of pages | 5 |
Journal | Journal of Crystal Growth |
Volume | 323 |
Issue number | 1 |
DOIs | |
State | Published - 15 May 2011 |
Keywords
- B1. Alloys
- A3. Molecular beam epitaxy
- B1. Oxides
- B2. Semiconducting II-VI materials
- B2. Semiconducting ternary compounds
- B1. Zinc compounds