TY - JOUR
T1 - Optical beam induced current microscopy at DC and radio frequency
AU - Kao, Fu Jen
N1 - Funding Information:
We gratefully acknowledge support of this research by the National Science Council of Taiwan under Grant No. NSC-90-2112-M-110 and by the Ministry of Education under Grant No. 89-B-FA08-1-4. Peter Török is an EPSRC Advanced Fellow.
PY - 2004
Y1 - 2004
N2 - In this paper we introduce the concept and technique of optical beam induced current (OBIC) generation at radio frequencies. The method is combined with lateral raster scanning of a tightly focused spot so as to generate a mapping of high spatial resolution. We demonstrate experimentally that if a mode-locked laser is used to excite the sample then the frequency transfer function of the optically active device is readily obtained with at least 1 μm spatial resolution, in real time. In addition, with the help of an appropriate electronic arrangement, we demonstrate how to obtain pseudo-colored OBIC images of the sample.
AB - In this paper we introduce the concept and technique of optical beam induced current (OBIC) generation at radio frequencies. The method is combined with lateral raster scanning of a tightly focused spot so as to generate a mapping of high spatial resolution. We demonstrate experimentally that if a mode-locked laser is used to excite the sample then the frequency transfer function of the optically active device is readily obtained with at least 1 μm spatial resolution, in real time. In addition, with the help of an appropriate electronic arrangement, we demonstrate how to obtain pseudo-colored OBIC images of the sample.
KW - Mode-locked laser
KW - Optical Beam Induced Current (OBIC)
KW - Radio Frequency (RF)
UR - http://www.scopus.com/inward/record.url?scp=3543080983&partnerID=8YFLogxK
U2 - 10.1117/12.528592
DO - 10.1117/12.528592
M3 - Conference article
AN - SCOPUS:3543080983
SN - 0277-786X
VL - 5353
SP - 143
EP - 150
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
T2 - Semiconductor Photodetectors
Y2 - 28 January 2004 through 29 January 2004
ER -