On the poor-verdú conjecture for the reliability function of channels with memory

F. Alajaji; Po-Ning Chen; Z. Rached

doi:10.1109/ISIT.2001.935987

On the poor-verdú conjecture for the reliability function of channels with memory

F. Alajaji^*, Po-Ning Chen, Z. Rached

^*Corresponding author for this work

Department of Electrical and Computer Engineering

Research output: Contribution to journal › Conference article › peer-review

Abstract

In a previous work, Poor and Verdú established an upper bound to the reliability function of arbitrary single-user discrete-time channels with memory. They also conjectured that their bound is tight for all coding rates. In this work, we demonstrate via a counterexample involving memoryless binary erasure channels that the Poor-Vendú upper bound is, unfortunately, not tight at low rates. We also examine possible improvements to this bound.

Original language	American English
Pages (from-to)	124
Number of pages	1
Journal	IEEE International Symposium on Information Theory - Proceedings
DOIs	https://doi.org/10.1109/ISIT.2001.935987
State	Published - 2001
Event	2001 IEEE International Symposium on Information Theory (ISIT 2001) - Washington, DC, United States Duration: 24 Jun 2001 → 29 Jun 2001

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10.1109/ISIT.2001.935987

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title = "On the poor-verd{\'u} conjecture for the reliability function of channels with memory",

abstract = "In a previous work, Poor and Verd{\'u} established an upper bound to the reliability function of arbitrary single-user discrete-time channels with memory. They also conjectured that their bound is tight for all coding rates. In this work, we demonstrate via a counterexample involving memoryless binary erasure channels that the Poor-Vend{\'u} upper bound is, unfortunately, not tight at low rates. We also examine possible improvements to this bound.",

author = "F. Alajaji and Po-Ning Chen and Z. Rached",

year = "2001",

doi = "10.1109/ISIT.2001.935987",

language = "American English",

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journal = "IEEE International Symposium on Information Theory - Proceedings",

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note = "2001 IEEE International Symposium on Information Theory (ISIT 2001) ; Conference date: 24-06-2001 Through 29-06-2001",

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AU - Alajaji, F.

AU - Chen, Po-Ning

AU - Rached, Z.

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N2 - In a previous work, Poor and Verdú established an upper bound to the reliability function of arbitrary single-user discrete-time channels with memory. They also conjectured that their bound is tight for all coding rates. In this work, we demonstrate via a counterexample involving memoryless binary erasure channels that the Poor-Vendú upper bound is, unfortunately, not tight at low rates. We also examine possible improvements to this bound.

AB - In a previous work, Poor and Verdú established an upper bound to the reliability function of arbitrary single-user discrete-time channels with memory. They also conjectured that their bound is tight for all coding rates. In this work, we demonstrate via a counterexample involving memoryless binary erasure channels that the Poor-Vendú upper bound is, unfortunately, not tight at low rates. We also examine possible improvements to this bound.

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U2 - 10.1109/ISIT.2001.935987

DO - 10.1109/ISIT.2001.935987

M3 - Conference article

AN - SCOPUS:0034857110

SN - 2157-8095

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JO - IEEE International Symposium on Information Theory - Proceedings

JF - IEEE International Symposium on Information Theory - Proceedings

T2 - 2001 IEEE International Symposium on Information Theory (ISIT 2001)

Y2 - 24 June 2001 through 29 June 2001

ER -

On the poor-verdú conjecture for the reliability function of channels with memory

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