On the origin of anomalous off-current under hot carrier stress in p-channel DDDMOS transistors with STI structure

Ching En Chen, Ting Chang Chang, Hua Mao Chen, Bo You, Kai Hsiang Yang, Szu Han Ho, Jyun Yu Tsai, Kuan Ju Liu, Ying Hsin Lu, Yu Ju Hung, Ya-Hsiang Tai, Tseung-Yuen Tseng

Research output: Contribution to journal › Article › peer-review

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Material Science

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Earth and Planetary Sciences