@inproceedings{a6f4faf7440247d9a446f4c317c2b56e,
title = "On-Chip Transient Detection Circuit for Microelectronic Systems Against Electrical Transient Disturbances due to ESD Events",
abstract = "A new on-chip transient detection circuit which can detect electrical disturbances of system-level electrostatic discharge (ESD) is proposed. The circuit is designed with reduced physical area by utilizing dual-latched structure. With hardware/firmware co-design method, auto-recovery procedure can be activated by the detection circuit when microelectronic systems suffer system-level ESD events. The immunity level of microelectronic products against the electromagnetic interference (EMI) of ESD events can be effectively improved. The proposed on-chip transient detection circuit has been verified in a 0.18-\boldsymbol{\mu}\mathbf{m} eMos process with 1.8-V devices under system-level ESD tests.",
keywords = "Electromagnetic compatibility (EMC), Electrostatic discharge (ESD), System-level ESD, Transient detection circuit",
author = "Chen, {Wen Chieh} and Ming-Dou Ker",
year = "2018",
month = jul,
day = "2",
doi = "10.1109/TENCONSpring.2018.8691901",
language = "English",
series = "2018 IEEE Region 10 Symposium, Tensymp 2018",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "36--39",
booktitle = "2018 IEEE Region 10 Symposium, Tensymp 2018",
address = "United States",
note = "null ; Conference date: 01-07-2018 Through 06-07-2018",
}