Abstract
We have successfully fabricated the symmetric vertical-channel Ni-salicided polycrystalline silicon thin-film transistors (VSA-TFTs) for the first time. The transfer characteristics of VSA-TFTs show a sharp turning between subthreshold and on state. The off -state currents can be improved by a modified overetching of oxide, equivalent dual-gate structure, and n+ floating-region length. The on-state currents can be enhanced by Ni-salicidation. The VSA-TFTs display a good subthreshold swing of 220 mV/dec, steep mobility increase (field-effect mobility of 76 cm2/Vċs), and large on/off-current ratio of more than 109(IOFF = 4×10-14\ ION=7×10-5 and W mask/Lmask =\break \hbox10μm/3μm).
Original language | English |
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Article number | 5559329 |
Pages (from-to) | 1233-1235 |
Number of pages | 3 |
Journal | IEEE Electron Device Letters |
Volume | 31 |
Issue number | 11 |
DOIs | |
State | Published - 1 Nov 2010 |
Keywords
- Ni-salicided
- polycrystalline silicon thin-film transistors (poly-Si TFTs)
- symmetric S/D
- vertical channel