| Original language | English |
|---|---|
| Pages | 491-498 |
| Number of pages | 8 |
| State | Published - 1 Dec 1983 |
NOVEL MEASUREMENTS OF ELECTRIC FIELD ENHANCED CARRIER EMISSION OF DEFECTS IN SILICON.
Z. F. Guan*, G. P. Li, K. L. Wang, Mau-Chung Chang
*Corresponding author for this work
Research output: Contribution to conference › Paper › peer-review
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