TY - JOUR
T1 - Nonthermal carrier dynamics in AlxGa1-xAs/GaAs quantum wells
AU - Sun, Kien-Wen
AU - Song, T. S.
AU - Wang, S. Y.
AU - Lee, C. P.
PY - 2000/5
Y1 - 2000/5
N2 - We present new time-resolved measurements that demonstrate the effect of injected carrier densities on carrier-carrier scattering rates of highly nonequilibrium carrier distributions in the p-doped Al0.32Ga0.68As/GaAs quantum wells with well width of 5 and 3 nm. The spectra at high densities (≥1010 cm-2) demonstrate that the initially narrow electron distribution is altered in a time less than or equal to the LO phonon emission time as the result of rapid carrier-carrier scattering. At about the same excitation density (approx. 1010 cm-2), the carrier-carrier scattering rate is faster in 3 nm quantum wells in comparison to 5 nm wells. Our results also indicate that carrier-carrier scattering becomes as significant as LO phonon emission at density of about 1 × 1010 cm-2 in the 5 nm quantum wells.
AB - We present new time-resolved measurements that demonstrate the effect of injected carrier densities on carrier-carrier scattering rates of highly nonequilibrium carrier distributions in the p-doped Al0.32Ga0.68As/GaAs quantum wells with well width of 5 and 3 nm. The spectra at high densities (≥1010 cm-2) demonstrate that the initially narrow electron distribution is altered in a time less than or equal to the LO phonon emission time as the result of rapid carrier-carrier scattering. At about the same excitation density (approx. 1010 cm-2), the carrier-carrier scattering rate is faster in 3 nm quantum wells in comparison to 5 nm wells. Our results also indicate that carrier-carrier scattering becomes as significant as LO phonon emission at density of about 1 × 1010 cm-2 in the 5 nm quantum wells.
UR - http://www.scopus.com/inward/record.url?scp=0033722925&partnerID=8YFLogxK
U2 - 10.1016/S0167-9317(99)00475-X
DO - 10.1016/S0167-9317(99)00475-X
M3 - Conference article
AN - SCOPUS:0033722925
SN - 0167-9317
VL - 51
SP - 189
EP - 194
JO - Microelectronic Engineering
JF - Microelectronic Engineering
T2 - LDSD'99: 3rd International Conference on Low Dimensional Structures and Devices
Y2 - 15 September 1999 through 17 September 1999
ER -