New transient detection circuit to detect ESD-induced disturbance for automatic recovery design in display panels

Cheng Cheng Yen; Wan Yen Lin; Ming-Dou Ker; Che Ming Yang; Shih Fan Chen; Tung Yang Chen

doi:10.1109/DTIS.2011.5941441

New transient detection circuit to detect ESD-induced disturbance for automatic recovery design in display panels

Cheng Cheng Yen^*, Wan Yen Lin, Ming-Dou Ker, Che Ming Yang, Shih Fan Chen, Tung Yang Chen

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

A new transient detection circuit against system-level electrostatic discharge (ESD) transient disturbance is proposed for display panel protection. The circuit function to detect positive or negative electrical transients under system-level ESD tests has been evaluated in HSPICE simulation and verified in 0.13-nm silicon chip. The output signal of the proposed transient detection circuit can be used as a firmware index to execute system automatic recovery operation. With hardware/firmware system co-design, the immunity of display panels against transient disturbance under system-level ESD tests can be enhanced.

Original language	English
Title of host publication	6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Technical Program
DOIs	https://doi.org/10.1109/DTIS.2011.5941441
State	Published - 31 Aug 2011
Event	6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Athens, Greece Duration: 6 Apr 2011 → 8 Apr 2011

Publication series

Name	6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Technical Program

Conference

Conference	6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11
Country/Territory	Greece
City	Athens
Period	6/04/11 → 8/04/11

Keywords

detection circuit
electrostatic discharge (ESD)
system-level ESD test

Access to Document

10.1109/DTIS.2011.5941441

Cite this

Yen, C. C., Lin, W. Y., Ker, M-D., Yang, C. M., Chen, S. F., & Chen, T. Y. (2011). New transient detection circuit to detect ESD-induced disturbance for automatic recovery design in display panels. In 6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Technical Program [5941441] (6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Technical Program). https://doi.org/10.1109/DTIS.2011.5941441

Yen, Cheng Cheng ; Lin, Wan Yen ; Ker, Ming-Dou et al. / New transient detection circuit to detect ESD-induced disturbance for automatic recovery design in display panels. 6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Technical Program. 2011. (6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Technical Program).

@inproceedings{3cb5f87252a442db8691618d756c444e,

title = "New transient detection circuit to detect ESD-induced disturbance for automatic recovery design in display panels",

abstract = "A new transient detection circuit against system-level electrostatic discharge (ESD) transient disturbance is proposed for display panel protection. The circuit function to detect positive or negative electrical transients under system-level ESD tests has been evaluated in HSPICE simulation and verified in 0.13-nm silicon chip. The output signal of the proposed transient detection circuit can be used as a firmware index to execute system automatic recovery operation. With hardware/firmware system co-design, the immunity of display panels against transient disturbance under system-level ESD tests can be enhanced.",

keywords = "detection circuit, electrostatic discharge (ESD), system-level ESD test",

author = "Yen, {Cheng Cheng} and Lin, {Wan Yen} and Ming-Dou Ker and Yang, {Che Ming} and Chen, {Shih Fan} and Chen, {Tung Yang}",

year = "2011",

month = aug,

day = "31",

doi = "10.1109/DTIS.2011.5941441",

language = "English",

isbn = "9781612848990",

series = "6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Technical Program",

booktitle = "6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Technical Program",

note = "6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 ; Conference date: 06-04-2011 Through 08-04-2011",

}

Yen, CC, Lin, WY, Ker, M-D, Yang, CM, Chen, SF & Chen, TY 2011, New transient detection circuit to detect ESD-induced disturbance for automatic recovery design in display panels. in 6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Technical Program., 5941441, 6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Technical Program, 6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11, Athens, Greece, 6/04/11. https://doi.org/10.1109/DTIS.2011.5941441

New transient detection circuit to detect ESD-induced disturbance for automatic recovery design in display panels. / Yen, Cheng Cheng; Lin, Wan Yen; Ker, Ming-Dou et al.
6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Technical Program. 2011. 5941441 (6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Technical Program).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - New transient detection circuit to detect ESD-induced disturbance for automatic recovery design in display panels

AU - Yen, Cheng Cheng

AU - Lin, Wan Yen

AU - Ker, Ming-Dou

AU - Yang, Che Ming

AU - Chen, Shih Fan

AU - Chen, Tung Yang

PY - 2011/8/31

Y1 - 2011/8/31

N2 - A new transient detection circuit against system-level electrostatic discharge (ESD) transient disturbance is proposed for display panel protection. The circuit function to detect positive or negative electrical transients under system-level ESD tests has been evaluated in HSPICE simulation and verified in 0.13-nm silicon chip. The output signal of the proposed transient detection circuit can be used as a firmware index to execute system automatic recovery operation. With hardware/firmware system co-design, the immunity of display panels against transient disturbance under system-level ESD tests can be enhanced.

AB - A new transient detection circuit against system-level electrostatic discharge (ESD) transient disturbance is proposed for display panel protection. The circuit function to detect positive or negative electrical transients under system-level ESD tests has been evaluated in HSPICE simulation and verified in 0.13-nm silicon chip. The output signal of the proposed transient detection circuit can be used as a firmware index to execute system automatic recovery operation. With hardware/firmware system co-design, the immunity of display panels against transient disturbance under system-level ESD tests can be enhanced.

KW - detection circuit

KW - electrostatic discharge (ESD)

KW - system-level ESD test

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T3 - 6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Technical Program

BT - 6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Technical Program

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Y2 - 6 April 2011 through 8 April 2011

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Yen CC, Lin WY, Ker M-D, Yang CM, Chen SF, Chen TY. New transient detection circuit to detect ESD-induced disturbance for automatic recovery design in display panels. In 6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Technical Program. 2011. 5941441. (6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Technical Program). doi: 10.1109/DTIS.2011.5941441

New transient detection circuit to detect ESD-induced disturbance for automatic recovery design in display panels

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