New transient detection circuit for system-level ESD protection

Cheng Cheng Yen*, Chi Sheng Liao, Ming-Dou Ker

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    5 Scopus citations

    Abstract

    A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is proposed. By including this new proposed on-chip transient detection circuit, a hardware/firmware solution cooperated with power-on reset circuit can be co-designed to fix the system-level ESD issues. The circuit performance to detect different positive and negative ESD-induced fast electrical transients has been investigated by HSPICE simulator and verified in silicon chip. The experimental results in a 0.18-μm CMOS process have confirmed that the proposed on-chip transient detection circuit can detect fast electrical transients during system-level ESD zapping.

    Original languageEnglish
    Title of host publication2008 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT
    Pages180-183
    Number of pages4
    DOIs
    StatePublished - 2008
    Event2008 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT - Hsinchu, Taiwan
    Duration: 23 Apr 200825 Apr 2008

    Publication series

    Name2008 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT

    Conference

    Conference2008 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT
    Country/TerritoryTaiwan
    CityHsinchu
    Period23/04/0825/04/08

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