New transient detection circuit for Electrical Fast Transient (EFT) protection design in display panels

Ming-Dou Ker; Wan Yen Lin; Cheng Cheng Yen; Che Ming Yang; Tung Yang Chen; Shih Fan Chen

doi:10.1109/ICICDT.2010.5510297

New transient detection circuit for Electrical Fast Transient (EFT) protection design in display panels

Ming-Dou Ker^*, Wan Yen Lin, Cheng Cheng Yen, Che Ming Yang, Tung Yang Chen, Shih Fan Chen

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

7 Scopus citations

Abstract

A new transient detection circuit against electrical fast transient (EFT) disturbance is proposed for display panel protection. The circuit function to detect positive or negative electrical transients under EFT tests has been investigated in HSPICE simulation and verified in silicon chip. The output of the proposed transient detection circuit can be used as a firmware index to execute system automatic recovery operation. With hardware/firmware co-design, the immunity of display panel against transient disturbance under EFT tests can be significantly improved.

Original language	English
Title of host publication	2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010
Pages	51-54
Number of pages	4
DOIs	https://doi.org/10.1109/ICICDT.2010.5510297
State	Published - 20 Aug 2010
Event	2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010 - Grenoble, France Duration: 2 Jun 2010 → 4 Jun 2010

Publication series

Name	2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010

Conference

Conference	2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010
Country/Territory	France
City	Grenoble
Period	2/06/10 → 4/06/10

Keywords

Electrical fast transient (EFT) test
Electromagnetic compatibility
Transient detection circuit

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10.1109/ICICDT.2010.5510297

Cite this

Ker, M.-D., Lin, W. Y., Yen, C. C., Yang, C. M., Chen, T. Y., & Chen, S. F. (2010). New transient detection circuit for Electrical Fast Transient (EFT) protection design in display panels. In 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010 (pp. 51-54). Article 5510297 (2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010). https://doi.org/10.1109/ICICDT.2010.5510297

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title = "New transient detection circuit for Electrical Fast Transient (EFT) protection design in display panels",

abstract = "A new transient detection circuit against electrical fast transient (EFT) disturbance is proposed for display panel protection. The circuit function to detect positive or negative electrical transients under EFT tests has been investigated in HSPICE simulation and verified in silicon chip. The output of the proposed transient detection circuit can be used as a firmware index to execute system automatic recovery operation. With hardware/firmware co-design, the immunity of display panel against transient disturbance under EFT tests can be significantly improved.",

keywords = "Electrical fast transient (EFT) test, Electromagnetic compatibility, Transient detection circuit",

author = "Ming-Dou Ker and Lin, {Wan Yen} and Yen, {Cheng Cheng} and Yang, {Che Ming} and Chen, {Tung Yang} and Chen, {Shih Fan}",

year = "2010",

month = aug,

day = "20",

doi = "10.1109/ICICDT.2010.5510297",

language = "English",

isbn = "9781424457748",

series = "2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010",

pages = "51--54",

booktitle = "2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010",

note = "2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010 ; Conference date: 02-06-2010 Through 04-06-2010",

}

Ker, M-D, Lin, WY, Yen, CC, Yang, CM, Chen, TY & Chen, SF 2010, New transient detection circuit for Electrical Fast Transient (EFT) protection design in display panels. in 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010., 5510297, 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010, pp. 51-54, 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010, Grenoble, France, 2/06/10. https://doi.org/10.1109/ICICDT.2010.5510297

New transient detection circuit for Electrical Fast Transient (EFT) protection design in display panels. / Ker, Ming-Dou; Lin, Wan Yen; Yen, Cheng Cheng et al.
2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010. 2010. p. 51-54 5510297 (2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - New transient detection circuit for Electrical Fast Transient (EFT) protection design in display panels

AU - Ker, Ming-Dou

AU - Lin, Wan Yen

AU - Yen, Cheng Cheng

AU - Yang, Che Ming

AU - Chen, Tung Yang

AU - Chen, Shih Fan

PY - 2010/8/20

Y1 - 2010/8/20

N2 - A new transient detection circuit against electrical fast transient (EFT) disturbance is proposed for display panel protection. The circuit function to detect positive or negative electrical transients under EFT tests has been investigated in HSPICE simulation and verified in silicon chip. The output of the proposed transient detection circuit can be used as a firmware index to execute system automatic recovery operation. With hardware/firmware co-design, the immunity of display panel against transient disturbance under EFT tests can be significantly improved.

AB - A new transient detection circuit against electrical fast transient (EFT) disturbance is proposed for display panel protection. The circuit function to detect positive or negative electrical transients under EFT tests has been investigated in HSPICE simulation and verified in silicon chip. The output of the proposed transient detection circuit can be used as a firmware index to execute system automatic recovery operation. With hardware/firmware co-design, the immunity of display panel against transient disturbance under EFT tests can be significantly improved.

KW - Electrical fast transient (EFT) test

KW - Electromagnetic compatibility

KW - Transient detection circuit

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U2 - 10.1109/ICICDT.2010.5510297

DO - 10.1109/ICICDT.2010.5510297

M3 - Conference contribution

AN - SCOPUS:77955645506

SN - 9781424457748

T3 - 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010

SP - 51

EP - 54

BT - 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010

T2 - 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010

Y2 - 2 June 2010 through 4 June 2010

ER -

Ker MD, Lin WY, Yen CC, Yang CM, Chen TY, Chen SF. New transient detection circuit for Electrical Fast Transient (EFT) protection design in display panels. In 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010. 2010. p. 51-54. 5510297. (2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010). doi: 10.1109/ICICDT.2010.5510297

New transient detection circuit for Electrical Fast Transient (EFT) protection design in display panels

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