New on-chip transient detection circuit to improve electromagnetic susceptibility of microelectronic systems

Xiao Rui Kang; Ming-Dou Ker

doi:10.1109/EDSSC.2017.8126515

New on-chip transient detection circuit to improve electromagnetic susceptibility of microelectronic systems

Xiao Rui Kang, Ming-Dou Ker

Institute of Electronics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is presented in this work. The circuit simulation and experimental results with silicon testchip in a 0.18-um CMOS process have confirmed that the new proposed circuit can successfully detect the occurrence of system-level ESD-induced electrical transient disturbance. The detection output can be used as system recovery index to restore the system from frozen or upset state to a stable and known state. Therefore, the immunity of microelectronic products against the system-level ESD test can be effectively enhanced.

Original language	English
Title of host publication	EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1-2
Number of pages	2
ISBN (Electronic)	9781538629079
DOIs	https://doi.org/10.1109/EDSSC.2017.8126515
State	Published - 1 Dec 2017
Event	13th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2017 - Hsinchu, Taiwan Duration: 18 Oct 2017 → 20 Oct 2017

Publication series

Name	EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits
Volume	2017-January

Conference

Conference	13th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2017
Country/Territory	Taiwan
City	Hsinchu
Period	18/10/17 → 20/10/17

Keywords

Electromagnetic susceptibility (EMS)
Electrostatic discharge (ESD)
System-level ESD
Transient detection circuit

Access to Document

10.1109/EDSSC.2017.8126515

Cite this

Kang, X. R., & Ker, M.-D. (2017). New on-chip transient detection circuit to improve electromagnetic susceptibility of microelectronic systems. In EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits (pp. 1-2). (EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits; Vol. 2017-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EDSSC.2017.8126515

Kang, Xiao Rui ; Ker, Ming-Dou. / New on-chip transient detection circuit to improve electromagnetic susceptibility of microelectronic systems. EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits. Institute of Electrical and Electronics Engineers Inc., 2017. pp. 1-2 (EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits).

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title = "New on-chip transient detection circuit to improve electromagnetic susceptibility of microelectronic systems",

abstract = "A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is presented in this work. The circuit simulation and experimental results with silicon testchip in a 0.18-um CMOS process have confirmed that the new proposed circuit can successfully detect the occurrence of system-level ESD-induced electrical transient disturbance. The detection output can be used as system recovery index to restore the system from frozen or upset state to a stable and known state. Therefore, the immunity of microelectronic products against the system-level ESD test can be effectively enhanced.",

keywords = "Electromagnetic susceptibility (EMS), Electrostatic discharge (ESD), System-level ESD, Transient detection circuit",

author = "Kang, {Xiao Rui} and Ming-Dou Ker",

note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 13th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2017 ; Conference date: 18-10-2017 Through 20-10-2017",

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Kang, XR & Ker, M-D 2017, New on-chip transient detection circuit to improve electromagnetic susceptibility of microelectronic systems. in EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits. EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits, vol. 2017-January, Institute of Electrical and Electronics Engineers Inc., pp. 1-2, 13th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2017, Hsinchu, Taiwan, 18/10/17. https://doi.org/10.1109/EDSSC.2017.8126515

New on-chip transient detection circuit to improve electromagnetic susceptibility of microelectronic systems. / Kang, Xiao Rui; Ker, Ming-Dou.
EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits. Institute of Electrical and Electronics Engineers Inc., 2017. p. 1-2 (EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits; Vol. 2017-January).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Ker, Ming-Dou

PY - 2017/12/1

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N2 - A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is presented in this work. The circuit simulation and experimental results with silicon testchip in a 0.18-um CMOS process have confirmed that the new proposed circuit can successfully detect the occurrence of system-level ESD-induced electrical transient disturbance. The detection output can be used as system recovery index to restore the system from frozen or upset state to a stable and known state. Therefore, the immunity of microelectronic products against the system-level ESD test can be effectively enhanced.

AB - A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is presented in this work. The circuit simulation and experimental results with silicon testchip in a 0.18-um CMOS process have confirmed that the new proposed circuit can successfully detect the occurrence of system-level ESD-induced electrical transient disturbance. The detection output can be used as system recovery index to restore the system from frozen or upset state to a stable and known state. Therefore, the immunity of microelectronic products against the system-level ESD test can be effectively enhanced.

KW - Electromagnetic susceptibility (EMS)

KW - Electrostatic discharge (ESD)

KW - System-level ESD

KW - Transient detection circuit

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BT - EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits

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Kang XR, Ker MD. New on-chip transient detection circuit to improve electromagnetic susceptibility of microelectronic systems. In EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits. Institute of Electrical and Electronics Engineers Inc. 2017. p. 1-2. (EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits). doi: 10.1109/EDSSC.2017.8126515

New on-chip transient detection circuit to improve electromagnetic susceptibility of microelectronic systems

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