New layout design for submicron CMOS output transistors to improve driving capability and ESD robustness

Ming-Dou Ker*, T. Y. Chen, H. H. Chang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Fingerprint

Dive into the research topics of 'New layout design for submicron CMOS output transistors to improve driving capability and ESD robustness'. Together they form a unique fingerprint.

Keyphrases

Material Science

Engineering