New Energy Transformation Model for the Unclamped Inductive Switching (UIS) Test

Iian Hsing Lee*, Kamna Nidhi, Chun Chih Chen, Ming Dou Ker

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

Energy handling capability based on the inductive load is one of the major concerns for the automotive applications. In this paper, a new unclamped inductive switching (UIS) test model is proposed that accounts for the impact of inductance on measurements for the first time. During the measurement it is found that the inductance at the current ramp-up period is higher than that at the current ramp-down period due to the hysteresis induced inductance decrease. Based on two different inductances for two different periods, the UIS test model is proposed and validated that can well match with the measured experimental results.

Original languageEnglish
Title of host publication2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728161693
DOIs
StatePublished - 20 Jul 2020
Event2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2020 - Singapore, Singapore
Duration: 20 Jul 202023 Jul 2020

Publication series

NameProceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
Volume2020-July

Conference

Conference2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2020
Country/TerritorySingapore
CitySingapore
Period20/07/2023/07/20

Keywords

  • avalanche breakdown
  • hysteresis
  • inductance
  • unclamped inductive switching (UIS)

Fingerprint

Dive into the research topics of 'New Energy Transformation Model for the Unclamped Inductive Switching (UIS) Test'. Together they form a unique fingerprint.

Cite this