New 4-Bit transient-to-digital converter for system-level ESD protection in display panels

Ming-Dou Ker; Cheng Cheng Yen

doi:10.1109/TIE.2011.2157292

New 4-Bit transient-to-digital converter for system-level ESD protection in display panels

Ming-Dou Ker^*, Cheng Cheng Yen

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

A new on-chip 4-bit transient-to-digital converter for system-level electrostatic discharge (ESD) protection design is proposed. The proposed converter is designed to detect ESD-induced transient disturbances and transfer different ESD voltages into digital codes under system-level ESD tests. The experimental results in a 0.13- μm CMOS integrated circuit with 1.8-V devices have confirmed the detection function and digital output codes. The proposed on-chip transient-to-digital converter can be codesigned with firmware operations to effectively enhance immunity of display systems against system-level ESD stresses.

Original language	English
Article number	5771998
Pages (from-to)	1278-1287
Number of pages	10
Journal	IEEE Transactions on Industrial Electronics
Volume	59
Issue number	2
DOIs	https://doi.org/10.1109/TIE.2011.2157292
State	Published - 1 Feb 2012

Keywords

Converter
electromagnetic compatibility
electrostatic discharge (ESD)
system-level ESD test
transient detection circuit

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10.1109/TIE.2011.2157292

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abstract = "A new on-chip 4-bit transient-to-digital converter for system-level electrostatic discharge (ESD) protection design is proposed. The proposed converter is designed to detect ESD-induced transient disturbances and transfer different ESD voltages into digital codes under system-level ESD tests. The experimental results in a 0.13- μm CMOS integrated circuit with 1.8-V devices have confirmed the detection function and digital output codes. The proposed on-chip transient-to-digital converter can be codesigned with firmware operations to effectively enhance immunity of display systems against system-level ESD stresses.",

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AB - A new on-chip 4-bit transient-to-digital converter for system-level electrostatic discharge (ESD) protection design is proposed. The proposed converter is designed to detect ESD-induced transient disturbances and transfer different ESD voltages into digital codes under system-level ESD tests. The experimental results in a 0.13- μm CMOS integrated circuit with 1.8-V devices have confirmed the detection function and digital output codes. The proposed on-chip transient-to-digital converter can be codesigned with firmware operations to effectively enhance immunity of display systems against system-level ESD stresses.

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KW - electromagnetic compatibility

KW - electrostatic discharge (ESD)

KW - system-level ESD test

KW - transient detection circuit

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New 4-Bit transient-to-digital converter for system-level ESD protection in display panels

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Keywords

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