@inproceedings{17f4973fba4848cfa2303a9df256d07a,
title = "Near unity internal quantum efficiency and reliable vertical-cavity surface-emitting lasers",
abstract = "Vertical-cavity surface-emitting lasers (VCSELs) with low power consumption and high efficiency offer excellent characteristics for many applications. In this report, we design and demonstrate GaAs-based 940 nm VCSEL devices with different output mirror reflectivity values demonstrating slope efficiency from 0.97-1.16 (W/A) and show near unity internal quantum efficiency and low internal loss of 6.6 (cm-1) at room temperature by using WIN Semiconductor 6-inch GaAs VCSEL wafer foundry service. Furthermore, the high temperature reliability test results guarantee quite long equivalent 14.6 years of operating time and stability.",
keywords = "GaAs wafer foundry, internal quantum efficiency, reliability, Vertical-cavity surface-emitting lasers",
author = "Huang, {Wei Hao} and Chi, {Kai Lun} and Chang, {Chun Tse} and Lin, {Yin Hsiang} and Cho, {Kai Sin} and Lu, {Tien Chang}",
note = "Publisher Copyright: {\textcopyright} 2023 SPIE.; Vertical-Cavity Surface-Emitting Lasers XXVII 2023 ; Conference date: 01-02-2023 Through 02-02-2023",
year = "2023",
doi = "10.1117/12.2648254",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Chun Lei and Graham, {Luke A.}",
booktitle = "Vertical-Cavity Surface-Emitting Lasers XXVII",
address = "美國",
}