Abstract
A new multiple-cell square-type layout design is proposed to realize the large-dimension output transistors for submicron low-voltage CMOS ICs. By using this layout design, the layout area of CMOS output buffers can be effectively reduced 30-40% with respect to the traditional finger-type layout. The drain-to-bulk parasitic capacitance of the output transistors is also reduced 40% by this square-type layout. Experimental results in a 0.6 μm CMOS process have shown that the maximum driving (sinking) capability per unit layout area of a CMOS output buffer realized by the proposed multiple-cell square-type layout is improved 54% (34%) more than that by the traditional finger-type layout. The human-body-model (machine-model) ESD robustness per unit layout area of the CMOS output buffer realized by the proposed multiple-cell square-type layout is increased 25.2% (17.3%) as comparing to that by the traditional finger-type layout.
Original language | English |
---|---|
Pages (from-to) | 1007-1014 |
Number of pages | 8 |
Journal | Solid-State Electronics |
Volume | 42 |
Issue number | 6 |
DOIs | |
State | Published - 1 Jan 1998 |