Multioutputs single-stage gate driver on array with wide temperature operable thin-film-transistor liquid-crystal display for high resolution application

Po-Tsun Liu, Guang Ting Zheng*, Yi Chen Lin

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

A hydrogenated amorphous silicon (a-Si:H) thin-film transistor (TFT) gate driver with multioutputs (eight outputs per stage) for high reliability, 10.7-inch automotive display has been proposed. The driver circuit is composed of one SR controller, eight driving TFTs (one stage to eight outputs) with bridging TFTs. The SR controller, which starts up the driving TFTs, could also prevent the noise of gate line for nonworking period. The bridging TFT, using width decreasing which connects between the SR controller and the driving TFT, could produce the floating state which is beneficial to couple the gate voltage, improves the driving ability of output, and reaches consistent rising time in high temperature and low temperature environment. Moreover, 8-phase clocks with 75% overlapping and dual-side driving scheme are also used in the circuit design to ensure enough charging time and reduce the loading of each gate line. According to lifetime test results, the proposed gate driver of 720 stages pass the extreme temperature range test (90°C and −40°C) for simulation, and operates stably over 800 hours at 90°C for measurement. Besides, this design is successfully demonstrated in a 10.7-inch full HD (1080 × RGB×1920) TFT-liquid-crystal display (LCD) panel.

Original languageEnglish
Pages (from-to)21-33
Number of pages13
JournalJournal of the Society for Information Display
Volume27
Issue number1
DOIs
StatePublished - Jan 2019

Keywords

  • amorphous silicon (a-Si)
  • gate driver
  • high reliability
  • thin film transistor (TFT)
  • wide temperature

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