Multi Heat-Sink CMOS-BEOL Integrated MEMS Pirani Gauge for Vacuum Detection in Packaged Microsensors

Manu Garg, Fang Wei Tsai, Sushil Kumar, Yi Chiu*, Pushpapraj Singh

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A multi-heat sink based MEMS Pirani gauge integrated in the back-end-of-line (BEOL) CMOS layers is designed and developed. The sandwiched heater line (SiO2/M2/SiO2) is designed in a meander configuration for improved heating efficiency. Multi heat-sink based design offers improved sensitivity and the thinner heater line offers reduced solid conduction losses and a lower detection limit. In a fully monolithically integrable process, the given gauge can be employed to detect vacuum levels from 4.6 Pa to 106 Pa. Experimental results agree with the simulated response with a maximum error of 0.16 %. Moreover, the successive measurements on the same device show a maximum error of 0.026 %, thereby indicating excellent repeatability.

Original languageEnglish
Title of host publication2023 22nd International Conference on Solid-State Sensors, Actuators and Microsystems, Transducers 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2173-2176
Number of pages4
ISBN (Electronic)9784886864352
StatePublished - 2023
Event22nd International Conference on Solid-State Sensors, Actuators and Microsystems, Transducers 2023 - Kyoto, Japan
Duration: 25 Jun 202329 Jun 2023

Publication series

Name2023 22nd International Conference on Solid-State Sensors, Actuators and Microsystems, Transducers 2023

Conference

Conference22nd International Conference on Solid-State Sensors, Actuators and Microsystems, Transducers 2023
Country/TerritoryJapan
CityKyoto
Period25/06/2329/06/23

Keywords

  • BEOL
  • CMOS-MEMS
  • MEMS
  • Pirani gauge
  • Vacuum detection

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