Modification of intrinsic defects in IZO/IGZO thin films for reliable bilayer thin film transistors

Nidhi Tiwari, Ram Narayan Chauhan, Po-Tsun Liu*, Han Ping D. Shieh

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

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Keyphrases

Engineering

Material Science