Method to evaluate cable discharge event (CDE) reliability of integrated circuits in CMOS technology

Tai Xiang Lai; Ming-Dou Ker

doi:10.1109/ISQED.2006.85

Method to evaluate cable discharge event (CDE) reliability of integrated circuits in CMOS technology

Tai Xiang Lai, Ming-Dou Ker

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

6 Scopus citations

Abstract

Cable discharge event (CDE) has been the main cause which damages the Ethernet interface in field applications. The transmission line pulsing (TLP) system has been the most popular method to observe electric characteristics of the device under human-body-model (HEM) electrostatic discharge (ESD) stress. In this work, the long-pulse transmission line pulsing (LP-TLP) system is proposed to simulate CDE reliability of the Ethernet integrated circuits, and the results are compared with the conventional 100-ns TLP system. The experimental results have shown that the CDE robustness of NMOS device in a 0.25-/spl mu/m CMOS technology is worse than its HBMESD robustness.

Original language	English
Title of host publication	Proceedings - 7th International Symposium on Quality Electronic Design, ISQED 2006
Pages	597-602
Number of pages	6
DOIs	https://doi.org/10.1109/ISQED.2006.85
State	Published - 1 Dec 2006
Event	7th International Symposium on Quality Electronic Design, ISQED 2006 - San Jose, CA, United States Duration: 27 Mar 2006 → 29 Mar 2006

Publication series

Name	Proceedings - International Symposium on Quality Electronic Design, ISQED
ISSN (Print)	1948-3287
ISSN (Electronic)	1948-3295

Conference

Conference	7th International Symposium on Quality Electronic Design, ISQED 2006
Country/Territory	United States
City	San Jose, CA
Period	27/03/06 → 29/03/06

Access to Document

10.1109/ISQED.2006.85

Cite this

@inproceedings{a14edc804d354f1bbb0d77eaa86cfb10,

title = "Method to evaluate cable discharge event (CDE) reliability of integrated circuits in CMOS technology",

abstract = "Cable discharge event (CDE) has been the main cause which damages the Ethernet interface in field applications. The transmission line pulsing (TLP) system has been the most popular method to observe electric characteristics of the device under human-body-model (HEM) electrostatic discharge (ESD) stress. In this work, the long-pulse transmission line pulsing (LP-TLP) system is proposed to simulate CDE reliability of the Ethernet integrated circuits, and the results are compared with the conventional 100-ns TLP system. The experimental results have shown that the CDE robustness of NMOS device in a 0.25-/spl mu/m CMOS technology is worse than its HBMESD robustness.",

author = "Lai, {Tai Xiang} and Ming-Dou Ker",

year = "2006",

month = dec,

day = "1",

doi = "10.1109/ISQED.2006.85",

language = "English",

isbn = "0769525237",

series = "Proceedings - International Symposium on Quality Electronic Design, ISQED",

pages = "597--602",

booktitle = "Proceedings - 7th International Symposium on Quality Electronic Design, ISQED 2006",

note = "7th International Symposium on Quality Electronic Design, ISQED 2006 ; Conference date: 27-03-2006 Through 29-03-2006",

}

Lai, TX & Ker, M-D 2006, Method to evaluate cable discharge event (CDE) reliability of integrated circuits in CMOS technology. in Proceedings - 7th International Symposium on Quality Electronic Design, ISQED 2006., 1613203, Proceedings - International Symposium on Quality Electronic Design, ISQED, pp. 597-602, 7th International Symposium on Quality Electronic Design, ISQED 2006, San Jose, CA, United States, 27/03/06. https://doi.org/10.1109/ISQED.2006.85

Method to evaluate cable discharge event (CDE) reliability of integrated circuits in CMOS technology. / Lai, Tai Xiang; Ker, Ming-Dou.
Proceedings - 7th International Symposium on Quality Electronic Design, ISQED 2006. 2006. p. 597-602 1613203 (Proceedings - International Symposium on Quality Electronic Design, ISQED).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Method to evaluate cable discharge event (CDE) reliability of integrated circuits in CMOS technology

AU - Lai, Tai Xiang

AU - Ker, Ming-Dou

PY - 2006/12/1

Y1 - 2006/12/1

N2 - Cable discharge event (CDE) has been the main cause which damages the Ethernet interface in field applications. The transmission line pulsing (TLP) system has been the most popular method to observe electric characteristics of the device under human-body-model (HEM) electrostatic discharge (ESD) stress. In this work, the long-pulse transmission line pulsing (LP-TLP) system is proposed to simulate CDE reliability of the Ethernet integrated circuits, and the results are compared with the conventional 100-ns TLP system. The experimental results have shown that the CDE robustness of NMOS device in a 0.25-/spl mu/m CMOS technology is worse than its HBMESD robustness.

AB - Cable discharge event (CDE) has been the main cause which damages the Ethernet interface in field applications. The transmission line pulsing (TLP) system has been the most popular method to observe electric characteristics of the device under human-body-model (HEM) electrostatic discharge (ESD) stress. In this work, the long-pulse transmission line pulsing (LP-TLP) system is proposed to simulate CDE reliability of the Ethernet integrated circuits, and the results are compared with the conventional 100-ns TLP system. The experimental results have shown that the CDE robustness of NMOS device in a 0.25-/spl mu/m CMOS technology is worse than its HBMESD robustness.

UR - http://www.scopus.com/inward/record.url?scp=84886744486&partnerID=8YFLogxK

U2 - 10.1109/ISQED.2006.85

DO - 10.1109/ISQED.2006.85

M3 - Conference contribution

AN - SCOPUS:84886744486

SN - 0769525237

SN - 9780769525235

T3 - Proceedings - International Symposium on Quality Electronic Design, ISQED

SP - 597

EP - 602

BT - Proceedings - 7th International Symposium on Quality Electronic Design, ISQED 2006

T2 - 7th International Symposium on Quality Electronic Design, ISQED 2006

Y2 - 27 March 2006 through 29 March 2006

ER -

Method to evaluate cable discharge event (CDE) reliability of integrated circuits in CMOS technology

Abstract

Publication series

Conference

Access to Document

Other files and links

Fingerprint

Cite this